Newsletter Signup
Where current and emerging technology trends meet.
TecTrendsInformation Sources, Inc.
  | About TecTrends | Email Signup | Contact Us
 Live Search:
Live Search | Articles | Companies | TecTerms | Products
  Loading TecTrends Live Search - please wait... 
View Noteworthy Articles      PRNewswire
 
Company

Nanofilm Technologie GmbH
Anna-Vandenhoeck-Ring 5
Gottingen,  DE  37081
Germany
Telephone: (49 ) 0 551-999600
Fax: (49) 0 551-9996010
URL: http://www.nanofilm.de
Email: info@nanofilm.de

Nanofilm Technologie GmbH, established in 1991, develops surface microscopy analysis instruments and accessories. The firm's ellipsometers are employed in measuring surface thickness and refractive indexes, detecting surface defects, and measuring structured samples. It introduced its Brewster Angle Microscope (BAM) in 1991. A BAM accessory, the LOM Liquid Level Controller, was introduced in 1994. The MiniBAM miniature microscope, developed in 1995, is used to study dry eye disease. The company's EP3 computer-controlled imaging ellipsometer was developed in 1997. Nanofilm Technologie introduced its first reflection spectrometer, the RefSPEC, in 2001. The EP3View software was developed in 2004. The Flounder surface chemical purity system was introduced in 2006. The firm also is known for its S-sens (R) sensor products, which analyze molecular reactions in real time. Nanofilm Technologie established its NFT LLC subsidiary, which distributes products in the United States, in 1996. In a joint venture with Surface Imaging Systems (S.I.S.), the company also founded Accurion LLC in 2000.

Equity Type: Private
Company Status: Active Date Founded: 1991

TecTerms:
 


Home About TecTrends About Us Contact Us Privacy Statement Terms and Conditions

TecTrends | P.O. Box 8120 | Berkeley CA 94707 | (510) 525-6220 | Email: tectrends@tectrends.com
© 2006 INFORMATION SOURCES INC | All rights reserved.