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Company

Nanometrics Inc
1550 Buckeye Dr
Milpitas,  CA  95035
United States
Telephone: (408) 435-9600
Fax: (408) 232-5910
URL: http://www.nanometrics.com
Email: info@nanometrics.com

Nanometrics Incorporated develops process control metrology systems that support film analysis, defect inspection, surface profiling, and other operations. The firm is known for its NanoOCD, NanoSpec, Nanometrics ORION, and Nano UDI product lines. It also offers users the N2000 and NanoNet metrology programs. N2000 allows distributed manufacturing systems to exchange data. NanoNet extends the software with network support features. Nanometrics' process control systems streamline chemical mechanical planarization (CMP), chemical vapor deposition (CVD), and lithography/etching semiconductor manufacturing operations. During CMP processing, the NanoCLP 9010 integrated copper laser profiler and NanoOCD(R)/DUV 9010 metrology systems measure film thickness and the uniformity of polished layers. Measurements are merged with production consumables and historical performance data, supporting the optimization of manufacturing operations. The NanoUDI 9010 inspection system identifies backside particles and defects. During CVD processing, the NanoOCD/DUV 9010 employs deep ultraviolet (DUV) measurement features in characterizing the optical properties of thin films and film stacks. The NanoOCD 9010M streamlines lithography and etching processes, providing semiconductor manufacturers with real-time photomask and reticle measurement and profiling tools. The Nanometrics FLX and Nanometrics Atlas (TM) standalone systems support multiple metrologies on a single platform.

Org. Type: Corporation Equity Type: Public
Company Status: Active
Symbol: NASDAQ:NANO

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